Strain modulation of transport criticality in RuO2-based thick-film resistors
نویسندگان
چکیده
منابع مشابه
Noise properties of thick-film resistors in extended temperature range
Results of thorough experimental studies on electrical properties of thick-film resistors (TFRs) have been overviewed and summarized. Experiments covered resistance and noise measurements in wide temperature range. Low-frequency noise spectroscopy has been used for the investigations of fluctuating phenomena. Sample resistors were prepared of various combinations of commercial and laboratory-ma...
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Thick-film resistors (TFRs) consist of a percolating network of conducting oxide nanoparticles dispersed in an insulating glassy matrix, whose resistive properties are dominated by quantum tunneling across insulating layers separating adjacent conducting grains. Tunneling processes are at the origin of the high sensitivity of the TFRs resistances to applied strains. We have measured transport a...
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The non-linear electro-ultrasonic spectroscopy was used as a non-destructive testing method for the polymer based and cermet thick film resistors evaluation. We carried out the correlation between this method and standard testing methods as noise spectroscopy and the third harmonic voltage measurements. The measuring set-up with the ultrasonic transducer working on the frequency range 10 kHz to...
متن کاملOn the Origin of Transport Non-Universality and Piezoresistivity in Segregated Conductor-Insulator Composites and Application to Thick-Film Resistors
In this thesis we address the description of electrical transport properties of disordered conductor-insulator composites, mostly by numerical Monte Carlo simulations and analytical study of realistic tunnelling-percolation models. Such composites are basically constituted by conducting particles dispersed in an insulating matrix and present a conductor-insulator phase transition, with critical...
متن کاملMeasurement of 1/f Noise in Carbon Composition and Thick Film Resistors
Thermal noise and 1/f noise are known to exist in carbon composition (CC) and thick film (TF) resistors. A circuit involving a differential instrumentation op-amp was used to measure the noise of a resistor under test. The noise spectra of these resistors were measured using a dynamic signal analyzer that performs an auto-correlation Fourier transform from the time domain to the frequency domai...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2004
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.1835996